TY  - GEN
AU  - Bunke,Horst
AU  - Kandel, Abraham
AU  - Last, Mark
TI  - Applied pattern recognition
U1  - 006.4 
PY  - 2008///
CY  - New York
PB  - Springer
KW  - Computer vision; Pattern recognition systems; Mathematics; Optical pattern recognition; Artificial intelligence; Engineering; Engineering mathematics
ER  -